Determination of Characteristic Relaxation Times and Their Significance in A Copper Oxide Thin Film

Emetere, Moses and Bakeko, M. (2013) Determination of Characteristic Relaxation Times and Their Significance in A Copper Oxide Thin Film. Journal of Theoretical Physics and Cryptography, 4. pp. 1-4.

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Abstract

The copper oxide thin film was characterized using both the theoretical and experimental approach at different oxidation temperatures between 150oC to 450oC. Two experimental methodologies were combined with theore0cal model to inves0gate the effect of time relaxations on the samples. The time relaxation of the current predicted the suitability of the sample to be used to fabricate either solar cell or semiconductor. The time relaxation of the voltage showed the degree of disorderliness created within the sample during fabrication.

Item Type:	Article
Uncontrolled Keywords:	Disordered structures; amorphous and glassy solids, Specific materials: fabrication, treatment, testing, and analysis.
Subjects:	Q Science > QA Mathematics > QA75 Electronic computers. Computer science Q Science > QC Physics
Divisions:	Faculty of Engineering, Science and Mathematics > School of Physics
Depositing User:	Mrs Patricia Nwokealisi
Date Deposited:	16 May 2018 13:59
Last Modified:	16 May 2018 13:59
URI:	http://eprints.covenantuniversity.edu.ng/id/eprint/10810

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