Solid State Properties of Copper- Silver- Sulphide Thin Film Deposited by Solution Growth Technique

Uhuegbu, C. C. (2011) Solid State Properties of Copper- Silver- Sulphide Thin Film Deposited by Solution Growth Technique. Journal of Emerging Trends in Engineering and Applied Sciences (JETEAS), 2 (1). pp. 113-116. ISSN 2141-7016

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Abstract

Chemical bath deposited Copper Silver Sulphide (CuAgS) thin films on glass substrates were studied for its optical properties using spectrophotometer. Some of the optical properties studied include absorbance, transmittance, reflectance, refractive index, optical conductivity, absorption coefficient, dielectric constant and extinction coefficient. The direct band gap obtained is 2.3eV and the indirect band gap is 1.1eV. Some of the possible applications of the film were discussed

Item Type:	Article
Subjects:	Q Science > QC Physics
Divisions:	Faculty of Engineering, Science and Mathematics > School of Physics
Depositing User:	Mr Adewole Adewumi
Date Deposited:	17 Aug 2011 23:56
Last Modified:	13 Dec 2011 21:14
URI:	http://eprints.covenantuniversity.edu.ng/id/eprint/505

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