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An Improved Iris Segmentation Technique Using Circular Hough Transform

Okokpujie, Kennedy O. and Noma-Osaghae, Etinosa and John, S. N. and Ajulibe, Akachukwu (2018) An Improved Iris Segmentation Technique Using Circular Hough Transform. In: Lecture Notes in Electrical Engineering. Lecture Notes in Electrical Engineering book series (LNEE, volume 450), 450 . Springer, Singapore, Singapore. ISBN 978-981-10-6454-8 (In Press)

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It is quite easy to spoof an automated iris recognition system using fake iris such as paper print and artificial lens. False Rejection Rate (FRR) and False Acceptance Rate (FAR) of a specific approach can be as a result of noise introduced in the segmentation process. Special attention has not been paid to a modified system in which a more accurate segmentation process is applied to an already existing efficient algorithm thereby increasing the overall reliability and accuracy of iris recognition. In this work an improvement of the already existing wavelet packet decomposition for iris recognition with a Correct Classification Rate (CCR) of 98.375% is proposed. It involves changing the segmentation technique used for this implementation from the integro-differential operator approach (John Daugman’s model) to the Hough transform (Wilde’s model). This research extensively compared the two segmentation techniques to show which is better in the implementation of the wavelet packet decomposition. Implementation of the integro-differential approach to segmentation showed an accuracy of 91.39% while the Hough Transform approach showed an accuracy of 93.06%. This result indicates that the integration of the Hough Transform into any open source iris recognition module can offer as much as a 1.67% improved accuracy due to improvement in its preprocessing stage. The improved iris segmentation technique using Hough Transform has an overall CCR of 100%.

Item Type: Book Section
Uncontrolled Keywords: Integro-differential operator Segmentation Wave packet decomposition False Rejection Rate (FRR) Hough transform False Acceptance Rate (FAR) Recognition Accuracy (RA)
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions: Faculty of Engineering, Science and Mathematics > School of Electronics and Computer Science
Depositing User: Dr. Etinosa Noma-Osaghae
Date Deposited: 04 Jan 2018 10:32
Last Modified: 04 Jan 2018 10:32

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