%0 Journal Article
%A Emetere, Moses
%A Bakeko, M.
%D 2013
%F eprints:10810
%J Journal of Theoretical Physics and Cryptography
%K Disordered structures; amorphous and glassy solids, Specific materials: fabrication, treatment, testing, and analysis.
%P 1-4
%T Determination of Characteristic Relaxation Times and Their  Significance in A Copper Oxide Thin Film
%U http://eprints.covenantuniversity.edu.ng/10810/
%V 4
%X The copper oxide thin film was characterized using both the theoretical and experimental approach at different oxidation  temperatures between 150oC to 450oC. Two experimental methodologies were combined with theore0cal model to inves0gate the  effect of time relaxations on the samples. The time relaxation of the current predicted the suitability of the sample to be used to  fabricate either solar cell or semiconductor. The time relaxation of the voltage showed the degree of disorderliness created within  the sample during fabrication.